InGaAs;photodiode;2000μm;2mm;TO-CAN;APD chip;avalanche Photodiode
Huang
Email: Hqy@ybphotonics.com
ingaas avalanche photodiode, Φ 2000μm, used for Distance measurement, Spatial light transmission, available in bare die, TO-CAN, pigtail, flange and other packages.
Absolute Maximum Ratings
| Parameter | Symbol | Min. | Type. | Max. | Unit |
|---|---|---|---|---|---|
| Storage Temperature | Tstg | -40 | 125 | ℃ | |
| Operating Temperature | Tc | -40 | — | 85 | ℃ |
| Reverse Current | IR | — | — | 10 | mA |
| Forward Current | IF | — | — | 10 | mA |
| Soldering Temperature /Time | Tsld/t | 260/10 | ℃/s |
Electro-Optical Characteristics (@ Tc=22±3℃)
| Parameter | Test Condition | Min. | Typ. | Max. | Unit |
|---|---|---|---|---|---|
| Responsivity1 | λ=1310nm | 0.9 | 0.98 | —— | A/W |
| Responsivity2 | λ=1550nm | 0.95 | 1.1 | —— | A/W |
| Dark Current | V=-1V | —— | 0.6 | 5 | nA |
| V=-5V | —— | 2 | 20 | nA | |
| Breakdown Voltage | I=-10µA | 40 | —— | —— | V |
| Capacitance | V=-2V,f=1MHz | —— | 220 | 250 | pF |
| V=-5V,f=1MHz | —— | 170 | 200 | pF | |
| Forward Voltage | I=1mA | —— | 0.39 | 0.7 | V |
As shown in Figure 1
| Parameter | Min. | Typ. | Max. | Unit | Notes |
|---|---|---|---|---|---|
| Die Width | 2190 | 2200 | 2210 | µm | |
| Die Length | 2190 | 2200 | 2210 | µm | |
| Detection Window | —— | 2000 | —— | µm | |
| Thickness | 190 | 200 | 210 | µm | |
| Bonding Pad Diameter | —— | 150 | —— | µm | For p-pad |

Figure 1
Attention: Handle with care, InP is a brittle material. The device can be permanently damaged when exposed to ESD.Specifications are subject to change without notice.

| GY | TG | _C | FW | _0 | MTP | F |
|---|---|---|---|---|---|---|
| TO Type:TO39 | Pin Type:C | Cap Type:Flat Windows | Product Type:PIN | Chip Type:GYMPD2000V1 | SupplierCode |
RoHS Compliance
This part is compliant with 2011/65/EU and 2015/863 RoHS directive (Restrictions on the Use of Certain Hazardous Substances in Electrical and Electronic Equipment).
Precaution:
(1) The modules should be handled in the same manner as ordinary semiconductor device to prevent the electro-static damages. The modules should be packaged with ESD proof material for safety keeping and carrying. The workbench, the soldering iron, and the human body should be grounded during the assembly of the modules.
(2) Please pay special attention to the atmosphere condition because the dew on the modules may cause electrical damages.